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Figure 4
(a–d) CTF-corrected HRTEM images and structural models along the [110] zone axis of (a) perfect UiO-66 and (b) a defective region, and along the [110] zone axis of (c) perfect UiO-66 and (d) a defective region. (e) Three different defects and their structure models. (f–g) CTF-corrected images along the [001] direction showing the defect distribution of the reo structure (f) and the scu structure (g). [Reproduced with permission from Springer Nature from the work of Liu, Chen et al. (2019BB50).]

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1270-1281
https://doi.org/10.1107/S1600576724007192
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