Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 1
Layout of the in-plane geometry for energy-dispersive X-ray topography in HexBay.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 5
|
October 2024
|
https://doi.org/10.1107/S1600576724007246
Open
access
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS