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Figure 3
Layout of a BH diffractometer with a nested Si (e.g. Si 220) and a GaAs 200 monochromator providing an identical beam path to the sample and with two separate analyzer crystals and detectors.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1282-1287
https://doi.org/10.1107/S1600576724007246
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