view article
Figure 5
Small-angle pattern of an etched grid with a nominal periodicity of 28 µm (Trinker, 2006BB15) measured with two triple-bounce Si 220 crystals (green dots and brown fitting line) and with two single-bounce GaAs 200 crystal slabs (red dots with blue fitting line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024|
https://doi.org/10.1107/S1600576724007246
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS