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Figure 5
Small-angle pattern of an etched grid with a nominal periodicity of 28 µm (Trinker, 2006BB15) measured with two triple-bounce Si 220 crystals (green dots and brown fitting line) and with two single-bounce GaAs 200 crystal slabs (red dots with blue fitting line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1282-1287
https://doi.org/10.1107/S1600576724007246
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