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Figure 6
The xUSANS pattern between 0.3 × 10−4 and 1.2 × 10−4 Å−1, i.e. in the range from the second to the fifth order of diffraction, taken with Si 220 (top) and GaAs 200 (bottom). See text for details.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024|
https://doi.org/10.1107/S1600576724007246
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