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Figure 7
Reconstructed images of the Siemens star chart data with different overlap ratios. (a)–(c) Amplitude (upper) and phase (lower) images reconstructed by (a) ePIE, (b) rPIE and (c) PINE, with overlap ratios indicated at the top. The black bars in the main images represent 4 µm, and those in the insets are 1 µm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1323-1335
https://doi.org/10.1107/S1600576724006897
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