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![[Figure 2]](uz5017fig2mag.jpg)
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Figure 2
A representation of the slit-smearing procedure [equation (1) ![[link]](../../../../../../logos/arrows/j_arr.gif){kind=small} ]. For each qx, the scattering intensity I(q) is integrated as a function of qy available [equation (3)]. |
![[Figure 2]](uz5017fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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