Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation

Perrin, T.; Chahine, G.A.; Arnaud, S.; Després, A.; Heugue, P.; Deschamps, A.; De Geuser, F.

doi:10.1107/S1600576724009294

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Scanning TEM bright-field images, (a) of the 2618A alloy aged for 2000 h at 473 K in the [001]_Al zone axis and (b) of the 2219 alloy aged for 2000 h at 473 K in the [011]_Al zone axis.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024| Pages 1800-1814

https://doi.org/10.1107/S1600576724009294

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