Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation

Perrin, T.; Chahine, G.A.; Arnaud, S.; Després, A.; Heugue, P.; Deschamps, A.; De Geuser, F.

doi:10.1107/S1600576724009294

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
(Top row) Examples of raw SAXS images obtained for (a) 2618A and (b) 2219. (Bottom row) Examples of raw WAXS images obtained for (c) 2618A and (d) 2219.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024|

https://doi.org/10.1107/S1600576724009294

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