Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation

Perrin, T.; Chahine, G.A.; Arnaud, S.; Després, A.; Heugue, P.; Deschamps, A.; De Geuser, F.

doi:10.1107/S1600576724009294

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
(Top row) Examples of raw SAXS images obtained for (a) 2618A and (b) 2219. (Bottom row) Examples of raw WAXS images obtained for (c) 2618A and (d) 2219.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024| Pages 1800-1814

https://doi.org/10.1107/S1600576724009294

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page