Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotation

Perrin, T.; Chahine, G.A.; Arnaud, S.; Després, A.; Heugue, P.; Deschamps, A.; De Geuser, F.

doi:10.1107/S1600576724009294

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
An illustration of the influence of grain size and sample thickness on the number of grains interacting with the X-ray beam for (a) 2618A and (b) 2219.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024|

https://doi.org/10.1107/S1600576724009294

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