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Figure 5
(a) Observed and (b) simulated 2D GISAXS patterns of the N-1.5 film. Inset in (a) is a zoomed-in view of the scattering stripes centered at qy ≃ 0.018 nm−1. Selected comparisons of the measured (symbols) and simulated (solid curves) GISAXS line profiles along (c) in-plane and (d) out-of-plane directions of the corresponding 2D GISAXS patterns, at the respective qz or qy positions indicated. (e) Observed and (f) simulated 2D GISAXS patterns for the D-1.5 film; measured and fitted GISAXS line profiles in the (g) in-plane and (h) out-of-plane directions.

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APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 6| December 2024| Pages 1871-1883
https://doi.org/10.1107/S1600576724010082
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