Figure 9
(a) Time-resolved, in-plane GISAXS profiles selectively extracted at qz = 0.05 Å−1 from the corresponding 2D GISAXS patterns in Fig. 8(a), measured during spin-coating of the CB solution of PTB7/PC71BT, without DIO. The thick and curved arrows indicate the growth and decay of the intensity in the very low q region (<0.001 Å−1) during the early (t1), intermediate (t1–t2) and late (t > t3) spin-coating stages. The thin long arrow indicates the growth and saturation of the SD peak at qy ≃ 0.002 Å−1. (b) Selected in-plane GISAXS profiles extracted at qz = 0.025 Å−1 (see Fig. S6 for details) for the film processed with 1.5% DIO. Data at t = 4, 48, 78 and 98 s are selectively fitted (solid curves) using a sphere model of radii of 53 ± 8, 56 ± 4, 60 ± 4 and 58 ± 3 nm, respectively. (c) The growth behaviors of Qinv (extracted from the corresponding time-resolved in-plane GISAXS profiles) during spin-coating of the PTB7–PC71BM films from the CB solutions, with the DIO concentrations indicated. (d) Time-dependent film thickness h (top) and film thinning rate dh/dt (bottom) measured using UV–Vis reflectance during film spin-coating without and with 3% DIO. The horizontal dotted lines label the constant-evaporation regions. The shaded zone marks the timing of SD in (a). |