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Figure 12
Orientation and strain maps for the Al gasket surrounding a sample similar to WG102. (a) IPF color maps of pixel orientation relative to the z and x axes in the sample reference frame. (b) Pixel orientation (lower hemisphere) for a selection of Miller indices. (c) Strain maps computed for several {hkl} diffraction rings. d is the d spacing for crystal planes, and d0 corresponds to the median d spacing for all diffraction peaks belonging to the selected {hkl} family over the whole sample. Strain is given in engineering convention (negative strain for shortening) and is expressed in a direction orthogonal to the orientation of the selected {hkl} crystal planes.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 6| December 2024|
https://doi.org/10.1107/S1600576724009634
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