Mapping domain structures near a grain boundary in a lead zirconate titanate ferroelectric film using X-ray nanodiffraction

Udovenko, S.; Son, Y.; Tipsawat, P.; Knox, R.J.; Hruszkewycz, S.O.; Yan, H.; Huang, X.; Pattammattel, A.; Zajac, M.; Cha, W.; Pagan, D.C.; Trolier-McKinstry, S.

doi:10.1107/S1600576724009026

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Experimental setup for the nanodiffraction measurements. The laboratory coordinate system is labeled xyz; the sample coordinate system is labeled x′y′z′. Diffracted intensity is emitted at an angle 2 $[\theta]$ from the incoming X-ray beam. The 002 PZT (1) and 200 PZT (2) diffraction peaks on the pixel array detector are labeled.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024| Pages 1789-1799

https://doi.org/10.1107/S1600576724009026

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