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Figure 8
Representative diffraction patterns measured at 0 kV cm−1, including a-domain peaks (a) and c-domain peaks (e) with masks; distribution of primary peak intensity for a and c domains [(b), (f)]; distribution of diffuse scattering from microstructure features around a-domain peaks and c-domain peaks [(c), (g)]; distribution of primary intensities divided by diffuse scattering [(d), (h)]. Grain boundary position shown with white dotted lines. Indicated in (b) is the 24° angle between [100] directions on the STO bi-crystal on which the epitaxial PZT was grown.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 6| December 2024| Pages 1789-1799
https://doi.org/10.1107/S1600576724009026
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