Advanced EXAFS analysis techniques applied to the L-edges of the lanthanide oxides

Smerigan, A.; Hoffman, A.S.; Ostervold, L.; Hong, J.; Perez-Aguillar, J.; Caine, A.C.; Greenlee, L.; Bare, S.R.

doi:10.1107/S1600576724010240

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Comparison of the k-space (top) and R-space (bottom) before and after MEE removal of the CeO₂ L₃-edge. The location of the MEE in k-space is indicated by a vertical, red dashed line.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 6| December 2024| Pages 1913-1923

https://doi.org/10.1107/S1600576724010240

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