Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 6
Average first shell Ln—O distances as determined by ionic radius, XRD and EXAFS analysis (this work). Distances generally follow the expected trend for Ln oxides and agree with XRD values.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 6
|
December 2024
|
Pages 1913-1923
https://doi.org/10.1107/S1600576724010240
Open
access
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS