Top dusted adhesive tape sample preparation method for the X-ray diffraction analysis of small powder sample volumes with the Bragg–Brentano setup

Dickes, D.; Glatzel, U.

doi:10.1107/S1600576724011920

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
(a) Bruker D8 Discover diffractometer in a Bragg–Brentano setup with a rotation sample stage, (b) a magnified portion of the sample stage, (c) a suitable deep-well sample holder and (d) a front-loading cavity sample holder.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 1| February 2025| Pages 276-282

https://doi.org/10.1107/S1600576724011920

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