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Figure 3
XRF spectra (blue dots) taken at different conditions and positions as marked in Fig. 2[link]. (a)–(c) XRF spectra from the centre position of the benign sample, marked with a star in Fig. 2[link], recorded at 2.1, 2.5 and 4.2 keV, respectively. (d) XRF spectra from an edge position of the benign sample, marked with a circle in Fig. 2[link], recorded at 2.5 keV. (e) XRF spectra of the DCIS sample, with position marked as a triangle in Fig. 2[link], recorded at 2.5 keV. (f) XRF spectra of the IDC sample, with position marked as a diamond in Fig. 2[link], recorded at 2.5 keV. The red line shows the XRF intensity calculated from the fitted model. The modelled emission lines for the different elements, elastic scattering peaks and estimated background are shifted vertically (i.e. divided by a factor of 2) to ease visibility of these peaks in the figure. For colour code, see figure legend. Some important peaks are explicitly marked; CaE marks the location of the escape peak for Ca. Data taken at 2.1 keV average four adjacent pixels, while data at 2.5 and 4.2 keV are spectra from single pixels.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 233-250
https://doi.org/10.1107/S1600576724011750
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