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Figure 5
Images of the apparent crystal positions for an initially pre-aligned crystal at φ of 14 and 194° using the standard optical centering method by focusing the microscope. The DAC was subsequently tilted by ±6 and ±8°. After tilting, a slightly offset crystal exhibits a noticeable image shift when the DAC is rotated 180° about the φ axis. The images display the corresponding φ angles on the diffractometer and indicate the displacement of the crystal from the optical microscope target in millimetres. The observed crystal offset and the difference in offset for a poorly centered crystal increases with tilt angle, demonstrating the enhanced sensitivity of the method.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 251-259
https://doi.org/10.1107/S1600576724012500
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