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Figure 1
(a) A simulated diffraction frame of a Pilatus 6M detector with pure azimuthal Poisson noise and (b) uncertainties for pixel intensity as measured with the distance to the mean (azimuthal model, blue) or from the Poisson model (orange).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 138-153
https://doi.org/10.1107/S1600576724011038
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