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Figure 4
Degradation of Rwork and Rfree crystallographic quality indicators on the integral dataset of HEWL + Ga (11k frames) and actual compression rates, when increasing the levels of sparsification.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 138-153
https://doi.org/10.1107/S1600576724011038
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