view article
Figure 5
Rwork and Rfree crystallographic quality indicators at different resolution shells obtained from the complete dataset (11k frames) of HEWL + Ga. The quality of the sparsified data (at 0.8σ and 2.0σ) is compared with the initial dataset.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 138-153
https://doi.org/10.1107/S1600576724011038
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS