A new technical solution to the problem of increasing the resolution of X-ray diffraction methods

Drmeyan, H.R.; Mkhitaryan, S.A.; Mkrtchyan, A.H.

doi:10.1107/S1600576724011130

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Moiré patterns: (a) formed in an X-ray three-crystal system; (b) enlarged without scanning the slit and X-ray film; (c) enlarged during the synchronous scanning of the slit and X-ray film.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 1| February 2025|

https://doi.org/10.1107/S1600576724011130

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