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Figure 2
Simulated SAED patterns are shown for (a) a randomly oriented bt8-Si crystal and (b) a randomly oriented st12-Si crystal. (c) A mixed-phase SAED pattern was simulated using a selection of spots from those in (a) and (b). (d–f) Spot-wise similarity scores are compared assuming 12 Si phases in the shown diffraction patterns when analyzing the patterns (a–c) with the poly algorithm. The spots are colored according to the related phase with the highest scores.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 128-137
https://doi.org/10.1107/S1600576724011178
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