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Figure 4
The experimental SAED patterns of the Si samples were extracted from Fig. 3[link](c) for pattern (a) and from other patterns in (b–d) considering g < 6 nm−1, and were analyzed by g and [{\gamma _{ij}}] information using the poly algorithm. The spots in (a–d) are colored according to the highest scores in the (e–h) bars. The open black circles represent scores less than the similarity threshold for Si phases. In (e–h) spot-wise similarity scores assuming the Si phases in the analysis are compared. The threshold score of 2 is shown as a red dashed line.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 128-137
https://doi.org/10.1107/S1600576724011178
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