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Figure 5
The fractions of spots attributed to the phases of silicon found to dominate the patterns shown in Fig. 4[link] are plotted as a function of the delay between the FIB preparation and SAED measurement of each pattern.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 128-137
https://doi.org/10.1107/S1600576724011178
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