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![[Figure 1]](xx5064fig1mag.jpg)
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Figure 1
Schematics of the scattering geometry for grazing-incidence X-ray diffraction, showing the various parameters for the derivation of the intensity correction factors. (a) Scattering geometry including the incident wavevector ki for an incident angle αi relative to the substrate surface, the axis of sample rotation φ and the wavevector of the scattered beam kf at the angles (αf, θf). The normalized polarization vector pv for a vertically polarized source and its projection pk onto the plane perpendicular to the scattered wavevector kf are relevant for the derivation of the polarization correction. (b) Detailed view of a detector pixel with dimensions psx and psz for the determination of the solid-angle correction. The angle between the detector normal nd and the wavevector of the scattered beam kf is denoted δ. (c) Overview of the different absorption effects related to the sample absorption (left) and to the absorption in the detector pixels (right). The thickness of the absorbing materials is ts for the sample and td for the detector, and the path lengths through the sample material considering a depth z are given by li and lf for the incident and scattered beams, respectively, and ld on the detector. |
![[Figure 1]](xx5064fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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