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Figure 4
Surface structures of three of the samples under investigation. (a) Optical micrograph in transmission mode of an LaB6 thin film on a glass substrate. (b) Optical micrograph in reflection mode of an anthracene thin film on a silicon substrate. (c) Photographic image of the fluorapatite single crystal, indicating the size of the flat surface used for GIXD measurements.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025| Pages 96-106
https://doi.org/10.1107/S1600576724010628
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