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Figure 5
GIXD measurement of an LaB6 thin film. (a) Measured GIXD pattern before application of the correction factors, showing Debye–Scherrer rings. (b) Histogram comparing measured peak intensities Imeas (blue: silicon substrate; orange and red: glass substrate) after application of the correction factors and calculated intensities Icalc (black) from single-crystal data. The histogram bars are centred around the q position of their respective Bragg peak and normalized with respect to the 111 peak. Reliability factors R for each measurement are given in the legend.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025|
https://doi.org/10.1107/S1600576724010628
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