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Figure 6
GIXD measurement of an anthracene thin film. (a) Measured GIXD pattern, showing distinct diffraction peaks of anthracene with (001) orientation. The peaks indicated with white arrows correspond to the silicon substrate. (b) Comparison between measured peak intensities Imeas (grey areas) and calculated intensities Icalc (black areas) centred around their respective positions in reciprocal space. Intensities are normalized with respect to the 110 peak. The reliability factor R is given in the grey box.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 1| February 2025|
https://doi.org/10.1107/S1600576724010628
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