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Figure 7
Illustration of topological defect identification in lamellar phases: (a) Two-dimensional representation of the phase field Ψ(r), derived from the inverted wave field S(r), visualized using a color gradient to highlight the phase distribution. (b) Magnified view of (a) showing the circulation path (red squares) used to compute the cumulative phase differences c. Pixels where the contour integral of the phase differences are equal to zero are identified, while non-zero values delineate lines of phase discontinuity, emphasizing the defect locations.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 2| April 2025|
https://doi.org/10.1107/S1600576725000317
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