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Figure 11
Simulation of bright DMS lines in Cu. Isotropic DS model for 7.82 keV X-rays, σ-polarization (χ = 90°). Incidence direction ω0 = 49.435° (Bragg angle of reflection 222) and Φ0 = 227.5° (multiple diffraction 222/[{\overline 2}02]) in the chosen crystal reference frame (inset), where A ∥ [111] and B ∥ [100] in equation (11)[link]. Line contrast is on a logarithmic scale. Solid angles are as observed by the arrays of the 100k (Ny = 487, Nx = 195) and 2M (Ny = 1679, Nx = 1475) detector pixels are indicated (white-outlined areas). For the 100k detector, P = [565 mm, 90°, 56.683°, 225.5°, 113.365°, 0, 35°, 0, 0]. For the 2M detector, P = [850 mm, 0,45°, 220°, 0, 91°, 0, 0, 0].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025| Pages 859-868
https://doi.org/10.1107/S1600576725003553
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