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Figure 4
X-ray reflectivity of the `forbidden' 002 reflection in silicon near the intersection of the 002 and 111 BCs, as a function of the incident beam direction (Φ0 and ω0 angles). Dynamical diffraction theory was applied for X-rays of 8 keV in a 100 µm thick Si(001) slab. (Inset) A 3D view of the reflectivity line profiles (on a linear scale) along the 002 and 111 BCs. Experimental data are reported elsewhere (Morelhão et al., 2002BB26; Domagała et al., 2016BB14).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025| Pages 859-868
https://doi.org/10.1107/S1600576725003553
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