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Figure 5
(a)–(d) Experimental observations and (e)–(h) simulations of DMS lines in a Cu(311) single crystal with high-flux synchrotron X-rays of 7.82 keV (λ = 1.585486 Å), σ-polarization (vertical scattering plane). (i) Detector assembly with pixel array rotated by 35° and centred at 565 mm from the sample, Diamond Light Source beamline I16 (Collins et al., 2010BB12), Pilatus 100k detector (487 × 195 pixels of 0.172 mm). (j) Crystal reference frame. ω0 and ω (detector's central pixel) are both equal to the Bragg angle θhkl with h = k = l in the range from 2.17 to 2.23, as indicated in the top panels. Φ0 = −134.56° and Φ = Φ0 + 180° in all cases. DMS line indices are shown in the bottom left-hand panel. Simulations are based on isotropic diffuse scattering to illuminate the DMS lines plus mosaicity at reflection [{\overline 2}02] to account for the behaviour of the intensity spot (red spot) on the 420 DMS line (more images available in the supporting information).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025| Pages 859-868
https://doi.org/10.1107/S1600576725003553
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