Interface densification in a microphase-separated diblock copolymer resolved by small-angle X-ray scattering

Lin, Y.-H.; Chen, Y.-C.; Sahare, A.; Lai, Y.-C.; Su, C.-J.; Tsai, J.-C.; Yamamoto, K.; Chen, H.-L.

doi:10.1107/S1600576725002638

Journal of Applied Crystallography Journal of Applied
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Figure 1
(a) Temperature-dependent SAXS profiles of PEO-b-P4VP collected in a cooling cycle. The scattering curves are shifted vertically for clarity. (b) Temperature-dependent SAXS profiles of PEO-b-P4VP without vertical shift. (c) Plot of the integrated peak intensities as a function of temperature, where I_m(q₁), I_m(q₂) and I_m(q₃) denote the intensity of the first-, second- and third-order peaks, respectively.

JOURNAL OF
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ISSN: 1600-5767

Volume 58| Part 3| June 2025| Pages 869-878

https://doi.org/10.1107/S1600576725002638

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