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Figure 1
Schematic diagram illustrating the DFXM setup in both the laboratory (xℓ, yℓ, zℓ) and sample (xs, ys, zs) coordinates. The incoming beam, aligned with the xℓ axis, is shaped by a 1D condenser to illuminate a specific (xℓ, yℓ) layer within the sample. The diffraction signal at the angle 2θ is focused by the CRL, creating a real-space image of the illuminated layer on the detector. The rotations χ and ϕ are shown around the xs and ys axes, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025| Pages 813-821
https://doi.org/10.1107/S1600576725002614
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