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![[Figure 4]](nb5398fig4mag.jpg)
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Figure 4
TEM images of crystals of (a) XeF2, (b), (c) XeF4, and (d), (e) XeF2·XeF4 used for 3D ED measurements. The red circles denote the beam sizes used for 3D ED data collection. |
![[Figure 4]](nb5398fig4.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 4
TEM images of crystals of (a) XeF2, (b), (c) XeF4, and (d), (e) XeF2·XeF4 used for 3D ED measurements. The red circles denote the beam sizes used for 3D ED data collection. |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
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