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![[Figure 6]](nb5398fig6mag.jpg)
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Figure 6
Starting frames of the 3D ED data collection on (a) XeF2, (b) XeF4 and (c) XeF2·XeF4 that show high-resolution reflections (dmin < 0.83 Å). |
![[Figure 6]](nb5398fig6.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 6
Starting frames of the 3D ED data collection on (a) XeF2, (b) XeF4 and (c) XeF2·XeF4 that show high-resolution reflections (dmin < 0.83 Å). |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
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