A simple cryotransfer method for 3D electron diffraction measurements of highly sensitive samples

Gurung, K.; Uran, E.; Motaln, K.; Brázda, P.; Radan, K.; Lozinšek, M.; Palatinus, L.

doi:10.1107/S1600576725002456

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
Crystal structures of XeF₂, XeF₄ and XeF₂·XeF₄, solved and dynamically refined from 3D ED data. Displacement ellipsoids are drawn at the 50% probability level.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 3| June 2025| Pages 1079-1084

https://doi.org/10.1107/S1600576725002456

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