Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 1
Comparison of YLID (Graw
et al.
, 2023
) (110 K) and WYLID (100 K) after Hirshfeld atom refinement, with their space groups and labelling schemes. Displacement ellipsoids are drawn at the 50% probability level.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58
|
Part 3
|
June 2025
|
https://doi.org/10.1107/S160057672500175X
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access
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