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![[Figure 2]](te5148fig2mag.jpg)
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Figure 2
Schematic of the proposed experiments for mounting and testing the forward-diffracted o-beam ABI setup. S – sample, D1 – detector 1, D2 – detector 2. For characterizing the forward-diffracted o-beam, D1 and D2 are scintillator detectors and S is excluded. For acquiring ABis with the forward-diffracted o-beam, S is included, D1 is an area detector (CCD) and D2 is a scintillator detector. For forward-diffracted o-beam double-crystal topography, D1 is a CCD, D2 is a scintillator detector and S is excluded. |
![[Figure 2]](te5148fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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