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Figure 3
(a) Sketch of the crystals designed for the experiment showing (i) the strain reliefs and (ii) the surface used for fixture, in order to avoid any spurious stresses in the diffraction bulk. (b) Crystals ready (after cutting, lapping and etching) to be mounted in the double-axis diffractometer for the EAT experiments. There is a small chamfer (dashed circle) in the crystal on the left. This is due the Si ingot border that was reached when cutting the crystal, but does not affect the functionality of the crystal, since the imaged area was ∼25 × 25 mm2.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025|
https://doi.org/10.1107/S1600576725002985
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