Analyzer-based X-ray phase contrast imaging using the forward-diffracted o-beam in a few-millimetre-thick Bragg-case asymmetrically cut crystal

Honnicke, M.G.; Manica, J.; Huang, X.

doi:10.1107/S1600576725002985

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
(a) 3 mm-thick Si asymmetric crystals with 444 reflection, mounted in the double-axis diffractometer for the EAT measurements. Both the forward-diffracted o-beam and the diffracted h-beam were measured by scintillation detectors. (b) Measured forward-diffracted o-beam (open red circles) and diffracted h-beam (open black circles) profiles.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 3| June 2025|

https://doi.org/10.1107/S1600576725002985

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