Analyzer-based X-ray phase contrast imaging using the forward-diffracted o-beam in a few-millimetre-thick Bragg-case asymmetrically cut crystal

Honnicke, M.G.; Manica, J.; Huang, X.

doi:10.1107/S1600576725002985

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
(a) Experimental ABI setup with the forward-diffracted o-beam, showing the sample holder in the inset (top view). (b) Diffracted h-beam and forward-diffracted o-beam showing the angular positions where the ABis of a polypropylene tube (c)–(e) were acquired. (f)–(h) Cross sections of ABis (c)–(e).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 3| June 2025|

https://doi.org/10.1107/S1600576725002985

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