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Figure 6
(a) Forward-diffracted o-beam double-crystal topography setup mounted in the double-axis diffractometer. The forward-diffracted o-beam is imaged by a CCD detector, while the diffracted h-beam is monitored by a scintillation detector. (b) Forward-diffracted o-beam double-crystal topography images (i)–(v) taken at different angular positions on the 3 mm-thick asymmetric Si analyzer crystal with 444 reflection. (c) Zoomed-in forward-diffracted o-beam double-crystal topography taken at the maximum positive slope position (ii) on the on the 3 mm-thick asymmetric Si analyzer crystal with 444 reflection and (d) the corresponding interplanar variation distance (Δd/d) map.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 3| June 2025|
https://doi.org/10.1107/S1600576725002985
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