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Figure 4
Experimental diffraction profile of Na2/3(Mn2/3Ni1/3)O2 and the extracted peaks. The diffraction profile was measured with an X-ray diffractometer (X'pert Pro, Malvern Panalytical) using Mo Kα radiation (60 kV, 50 mA). The diffraction profile was recorded at a scanning rate of 1.5° min−1 in the 2θ range of 5–50°. |