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Figure 3
Superimposition of the three beam images captured during the calibration process. Labels refer to the reference position (1) and the shifted positions along the x axis (2) and y axis (3).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1677-1687
https://doi.org/10.1107/S1600576725006892
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