Detecting grain-scale plastic deformation events with time-resolved far-field high-energy diffraction microscopy

Jin, Y.; Li, W.; Das, A.; Shanks, K.; Bucsek, A.

doi:10.1107/S1600576725007009

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Overview of the work, showing the different methods for detecting grain-scale plastic deformation events using ff-HEDM. (a) Equivalent stress relaxation (Method 1), (b) RSS relaxation (Method 2), (c) orientation change (Method 3) and (d) diffraction peak shape change (Method 4).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 58| Part 5| October 2025| Pages 1712-1727

https://doi.org/10.1107/S1600576725007009

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