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Figure 2
(a) The ff-HEDM experiment setup, where ω is the sample rotation angle, 2θ is the diffraction angle and η is the azimuthal angle. (b) Sample placed in the RAMS load frame on the FAST beamline. (c) Stress curve during creep loading. The black line represents the macroscopic stress measured by the load cell, while the red line shows the average loading-direction stress obtained from ff-HEDM, weighted by grain volume. Only the portion of the data used in this study is shown.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 5| October 2025| Pages 1712-1727
https://doi.org/10.1107/S1600576725007009
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